Sensitivity measurements of a microchannel plate intensified x-ray detector in the 100-1500 eV photon energy range (abstract)

Review of Scientific Instruments

Volumn 70, Issue 1, 1999, Pages 646-

  Ruggles, L E ^a   Porter, J L ^a   Simpson, W W ^a   Vargas, M F ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039258298     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149525     Document Type: Article

References (0)