Analytical investigation of grain boundaries of compressive deformed Al-doped sintered β-SiC

Materials Science and Engineering: A

Volumn 285, Issue 1-2, 2000, Pages 136-143

  Kaneko, Kenji ^a   Honda, Sawao ^a   Nagano, Takayuki ^a   Saitoh, Tomohiro ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

Deformation; Electron energy loss spectroscopy; Energy dispersive X ray spectroscopy; Grain boundary; High resolution transmission electron microscopy; Scanning transmission electron microscope; SiC; Sintering additives

Indexed keywords

ALUMINA; ALUMINUM; COMPRESSIVE STRESS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

CERMETS;

EID: 0039174318     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(00)00638-9     Document Type: Article

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