Radiation damage of oxygenated silicon diodes by 27 MeV protons

Nuovo Cimento della Societa Italiana di Fisica A

Volumn 112, Issue 11, 1999, Pages 1377-1382

  Bisello, D ^a,b   Descovich, M ^b   Kaminsky, A ^a   Pantano, D ^a,b   Wyss, J ^c   Zanet, A ^d  

^a SEZIONE DI PADOVA   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

^c ECT   (Italy)

^d Consorzio Padova Ricerche ^*  (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039132813     PISSN: 03693546     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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11. EVANS EUROPA, Brunel University, Uxbridge, Middlesex UB8 3PH, UK.
12. HUHTINEN M., AARNIO P., Estimation of pion induced displacement damage in silicon, HV-SEFT R 1993-C2, May 1993.