Thermoanalytic measurements with oxides at temperatures up to 2000°C

Thermochimica Acta

Volumn 339, Issue 1-2, 1999, Pages 111-116

  Klimm, D ^a  

^a LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

Author keywords

DTA; Mass spectrometry; TG

Indexed keywords

EID: 0039132401     PISSN: 00406031     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6031(99)00220-8     Document Type: Article

References (6)

1. A.D. Pelton, in: P. Haasen (Ed.), Materials Science and Technology, vol 5, VCH, Weinheim, 1991, pp. 1-73.
2. Database SUV96G02-SGTE Pure Substance Data, University Version, 1996 and program code by GTT Technologies, Herzogenrath, Germany.
3. Ganschow S., Klimm D., Reiche P., Uecker R. Cryst. Res. Technol. 34:1999;615.
4. Gmelin Handbook of Inorganic Chemistry: W - Tungsten, 8th ed., Gmelin Institute of Inorganic Chemistry, Springer, New York, 1984.
5. Halvorson J.J., Wimber R.T. J. Appl. Phys. 43:1972;2519.
6. G.W.H. Höhne, W. Hemminger, H.-J. Flammersheim, Differential Scanning Calorimetry, Springer, Berlin, 1996, p. 75.