Measurement of the mean free path of dislocation glide in the InGaAs/GaAs materials system

Journal of Applied Physics

Volumn 79, Issue 2, 1996, Pages 776-780

  Matragrano, M J ^a   Ast, D G ^a   Watson, G P ^b   Shealy, J R ^a  

^a Cornell University   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039116167     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360824     Document Type: Article

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