Measurement of index of refraction of InxAl1-xAs epitaxial layer using in situ laser reflectometry

Applied Physics Letters

Volumn 68, Issue 17, 1996, Pages 2355-2357

  Baek, Jong Hyeob ^a   Lee, Bun ^a   Choi, Sung Woo ^a   Lee, Jin Hong ^a   Lee, El Hang ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039033974     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115856     Document Type: Article

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