Microstructure of diamond and β-SiC interlayer studied by synchrotron x-ray scattering

Journal of Applied Physics

Volumn 80, Issue 5, 1996, Pages 2791-2798

  Je, J H ^a   Noh, D Y ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039021448     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363197     Document Type: Article

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