Structural analysis of ferromagnetic latent tracks in RCo2 thin films (R = Y,Tm,Ce) by means of X-ray diffraction

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 107, Issue 1-4, 1996, Pages 344-348

  Ghidini, M ^a   Nozieres J P ^a   Givord, D ^a   Lienard A ^a   Gervais, B ^b   Dooryhee E ^b  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b Centre Interdisciplinaire de Recherche Ions Lasers   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039015479     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00799-7     Document Type: Article

References (12)

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