Goodness of fit tests with misclassified data based on φ-divergences

Biometrical Journal

Volumn 42, Issue 2, 2000, Pages 223-237

  Pardo, L ^a   Zografos, K ^b  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b UNIVERSITY OF IOANNINA   (Greece)

Author keywords

Double sampling; Goodness of fit; Local alternatives; Misclassification; Pitman efficiency; divergence statistic

Indexed keywords

SAMPLING;

BINOMIAL DATA; DOUBLE SAMPLING SCHEMES; DOUBLE-SAMPLING; GOODNESS OF FIT; LOCAL ALTERNATIVE; MISCLASSIFICATIONS; MULTINOMIAL DISTRIBUTIONS; PITMAN EFFICIENCY; TEST STATISTICS; Φ-DIVERGENCE STATISTIC;

STATISTICAL TESTS;

EID: 0039012099     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4036(200005)42:2<223::AID-BIMJ223>3.0.CO;2-T     Document Type: Article

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