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Volumn 3, Issue 3, 1997, Pages 159-165
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Generation of dislocations and subgrains in semisolid Al-6.2wt%Si alloy
a b a c |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM METALLOGRAPHY;
ELECTRON DIFFRACTION;
GRAIN BOUNDARIES;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
PILES;
SHEAR STRESS;
CONVERGENT BEAM ELECTRON DIFFRACTION (CBED);
DEGREE OF ENTANGLEMENT;
DISLOCATION DENSITIES;
GRAIN-BOUNDARY MELTING;
HIGH ANGLE BOUNDARIES;
MISORIENTATIONS;
PRIMARY SOLID PARTICLES;
SELECTED AREA DIFFRACTION PATTERNS;
SILICON ALLOYS;
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EID: 0038969295
PISSN: 12259438
EISSN: None
Source Type: Journal
DOI: 10.1007/BF03025956 Document Type: Article |
Times cited : (7)
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References (7)
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