Determination of high-angle grain-boundary misorientations in melt-textured Y-Ba-Cu-O using transmission electron microscopy studies of intragrain structure

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 79, Issue 5, 1999, Pages 1079-1094

  Mironova, M ^a   Du, G ^a   Sathyamurthy, S ^a   Salama, K ^a  

^a UNIVERSITY OF HOUSTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038931180     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619908210348     Document Type: Article

References (21)

1. Alarco, J. A., Olsson, E., Golden, S. J., Bharagava, A., Yamashita, T., and MacKinnon, I. D. R. 1997, Mater. Res., 12, 624.
2. Alexander, K. B., Goyal, A., Kroeger, D. M., Selvamanickam, V., and Salama, K., 1992, Phys. Rev. B, 45, 5622.
3. Babcock, S. E., Cai, X. Y., Kaiser, D. L., and Larbalestier, D. C., 1990, Nature, Ml, 167.
4. Chen, J. G., Shi, D., Wayman, C. M., McGinn, P. J., Chen W. H., and Zhu, N., 1992, Mater. Lett., 14, 177.
5. Dimos, D., Chaudhari, P., and Mannhart, J., 1990, Phys. Rev. B, 41, 4038.
6. Eom, C. B., Marshall, A. F., Suzuki, Y., Boyler B., Pease R. F. W., and Geballe, T. H., 1991, Nature, 353, 546.
7. Field, M. B., Cai, X. Y., Babcock, S. E., and Larbalestier, D. C., 1993, IEEE Trans. Supercond., 3, 1479.
8. Fu, C. M., Juang, J. Y., Chen, M. F., Wu, K. H., Uen, T. M., and Gou, Y. C., 1995, IEEE Trans, appl. Supercond., 5, 2196.
9. Goyal, A., Specht, E. D., and Kroger, D. M., 1965, Appl. Phys. Lett., 68, 711.
10. Mironova, M., Du, G., Rusakova, I., and Salama, K., 1996, Physica, 271, 15.
11. Nakahara, S., Fisanick, G. J., Yan, M. F., Van Dover, R. B, Boone, T., and Moore, R., 1987, J. Crystal Growth, 85, 639.
12. Parikh, A. S., Meyer, B., and Salama, K., 1994, Supercond. Sci. Technol., 7, 455.
13. Randle, V., 1993, The Measurement of Grain Boundary Geometry, edited by B. Cantor and M. J. Goringer (London: Institute of Physics).
14. Salama, K., Selvamanickam, V., Gao, L., and Sun, K., 1989, Appl. Phys. Lett., 54, 2352.
15. Sandiumenge, F., Vilata N., Pinol, S., Martinez, B., and Obradors, X., 1995, Phys. Rev. B, 51, 6645.
16. Suzuki, H., Ohkubo, T., Hirotsu, Y., Mitoh, Y., Chen, J., Yamashita, T., Minami- kawa, T., Morimoto, A., and Shimizu, T., 1993, private communication.
17. Utevsky, L. M., 1973, Electron Microscopy Diffraction in Metal Science (Moscow: Metallur- giya), p. 583 (in Russian).
18. Vilata, N., Sandiumenge, F., Rodriguez, E., Martinez, B., Piñol, S., Obradors, X., and Rabier, J., 1997, Phil. Mag. B, 75, 431.
19. Wolf, D., 1992, Materials Interfaces, edited by D. Wolf and S. Yip (London: Chapman & Hall), p. 18.
20. Yan, Y., Cardwell, D. A., Campbell, A. M., and Stobbs, W. M., 1996, J. Mater. Res., 11, 2990.
21. Zhu, Y., Zhang, H., Wang, H., and Suenaga, M., 1991, J. Mater. Res., 6, 2507.