Contact electrode diffusion into C60 thin films

Synthetic Metals

Volumn 86, Issue 1-3, 1997, Pages 2331-2332

  Firlej, L ^a   Zahab, A ^a   Brocard, F ^a   Kirova, N ^a,b  

^a UNIV MONTPELLIER   (France)

^b LANDAU INSTITUTE FOR THEORETICAL PHYSICS   (Russian Federation)

Author keywords

Conductivity; Diffusion; Fullerenes; Transport measurements

Indexed keywords

ACTIVATION ENERGY; CRYSTAL LATTICES; DIFFUSION; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTRODES; THIN FILMS;

INTERCALATION; TRANSPORT MEASUREMENT;

FULLERENES;

EID: 0038913904     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(97)81147-2     Document Type: Article

References (4)

1. A. Zahab, L. Firlej, F. Brocard and N. Kirova, Synth. Met., 77 (1996) 59.
2. L. Firlej, A. Zahab and N. Kirova, Phys. Rev. submitted.
3. D. Sarkar and N.J. Halas, Appl. Phys. Lett., 63 (1993) 2438.
4. C. Goze, PhD thesis, Montpellier, 1996.