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Volumn 49, Issue 1, 1997, Pages 22-28
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Studies on layer disorder, microstructural parameters and other properties of tantalum substituted tungsten-molybdenum selenide, W0.65Mo0.35-xTaxSe2 (0≤×≤0.35)
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Author keywords
Molybdenum diselenide; Tantalum diselenide; Tungsten diselenide
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL MICROSTRUCTURE;
DISLOCATIONS (CRYSTALS);
ELECTRIC CONDUCTIVITY OF SOLIDS;
MAGNETIC PROPERTIES;
MICROSCOPIC EXAMINATION;
MOLYBDENUM COMPOUNDS;
SELENIUM COMPOUNDS;
TANTALUM COMPOUNDS;
THERMOELECTRICITY;
TUNGSTEN COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
LAYER DISORDER;
MOLYBDENUM DISELENIDE;
TANTALUM DISELENIDE;
TUNGSTEN DISELENIDE;
SEMICONDUCTING SELENIUM COMPOUNDS;
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EID: 0038909691
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/S0254-0584(97)80122-8 Document Type: Article |
Times cited : (10)
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References (34)
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