Measurement of indium segregation in strained InxGa1-xAs/GaAs quantum wells by transmission electron microscopy

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 75, Issue 3, 1997, Pages 803-821

  McCaffrey, J P ^a   Wasilewski, Z R ^a   Robertson, M D ^b   Corbett, J M ^c  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b Cornell University   (United States)

^c UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038905446     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619708207203     Document Type: Article

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