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Journal of Magnetism and Magnetic Materials

Volumn 192, Issue 1, 1999, Pages 11-18

Magnetic and structural measurements of lattice-matched erbium films on sapphire [1 1 0] and [0 0 1] substrates

(4) Helgesen, G a Conover, M J b Gibbs, Doon c Flynn, C P b

a INSTITUTE FOR ENERGY TECHNOLOGY (Norway)

b United States of America (United States)

c BROOKHAVEN NATIONAL LABORATORY (United States)

Author keywords

75.25.+z; 75.60. d; 75.70. i; 78.70.Ck; Epitaxial strain; Lock in transitions; Magnetic X ray scattering; Magnetization; Thin films

Indexed keywords

EID: 0038853593 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-8853(98)00371-0 Document Type: Article

Times cited : (2)

References (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.