Structural and optical characterization of CulnS2 thin films grown by vacuum evaporation method

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 5-7, 2003, Pages 291-294

  Akaki, Y ^a   Komaki, H ^b   Yoshino, K ^b   Ikari, T ^b  

^a MIYAKONOJO NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF MIYAZAKI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER COMPOUNDS; EVAPORATION; GRAIN SIZE AND SHAPE; MORPHOLOGY; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; VACUUM APPLICATIONS;

CHALCOPYRITE; ELECTRON PROBE MICROANALYSIS; SINGLE-SOURCE THERMAL EVAPORATION; VACUUM EVAPORATION METHOD;

SEMICONDUCTOR MATERIALS;

EID: 0038825735     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1023959525125     Document Type: Article

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