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Volumn 150, Issue 3, 2003, Pages 185-193

Prediction of EMI effects in operational amplifiers by a two-input Volterra series model

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; FREQUENCY DOMAIN ANALYSIS; TIME DOMAIN ANALYSIS;

EID: 0038825169     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20030342     Document Type: Article
Times cited : (19)

References (20)
  • 2
    • 0003475532 scopus 로고
    • Tech. Rep. MDC E1929, McDonnell Douglas Astronautic Company, St. Louis, MO
    • 'Integrated circuit electromagnetic susceptibility handbook'. Tech. Rep. MDC E1929, McDonnell Douglas Astronautic Company, St. Louis, MO, 1978
    • (1978) Integrated Circuit Electromagnetic Susceptibility Handbook
  • 3
    • 0038386953 scopus 로고    scopus 로고
    • Tech. Rep. NASA/CR-2000-210017: Boeing Information, Space and Defense Systems, Seattle, WA
    • Sketoe, J.G.: 'Integrated circuit electromagnetic immunity handbook'. Tech. Rep. NASA/CR-2000-210017: Boeing Information, Space and Defense Systems, Seattle, WA, 2000
    • (2000) Integrated Circuit Electromagnetic Immunity Handbook
    • Sketoe, J.G.1
  • 4
    • 0018545592 scopus 로고
    • A modified Ebers-Moll transistor model for RF-interference analysis
    • Larson, C.E., and Roe, J.E. 'A modified Ebers-Moll transistor model for RF-interference analysis', IEEE Trans. Electromagn. Compat., 1979, 21, (4), pp. 283-290
    • (1979) IEEE Trans. Electromagn. Compat. , vol.21 , Issue.4 , pp. 283-290
    • Larson, C.E.1    Roe, J.E.2
  • 7
    • 0019084308 scopus 로고
    • Macromodel predictions for EMI in bipolar opamps
    • Chen, G.K.C., and Whalen, J.J.: 'Macromodel predictions for EMI in bipolar opamps', IEEE Trans. Electromagn. Compat., 1980, EMC-22, (2), pp. 262-265
    • (1980) IEEE Trans. Electromagn. Compat. , vol.EMC-22 , Issue.2 , pp. 262-265
    • Chen, G.K.C.1    Whalen, J.J.2
  • 8
    • 0026953386 scopus 로고
    • EMI-induced failures in integrated circuit opamps
    • Graffi, S., Masetti, G., and Golzio, D.: 'EMI-induced failures in integrated circuit opamps', Microelectron. Reliab., 1992, 32, (11), pp. 1551-1557
    • (1992) Microelectron. Reliab. , vol.32 , Issue.11 , pp. 1551-1557
    • Graffi, S.1    Masetti, G.2    Golzio, D.3
  • 13
    • 0020268431 scopus 로고
    • MOS opamp design: A tutorial overview
    • Gray, P. R., and Meyer, R.G.: 'MOS opamp design: a tutorial overview', IEEE J. Solid-State Circuits, 1982, 17, (6), pp. 969-982
    • (1982) IEEE J. Solid-State Circuits , vol.17 , Issue.6 , pp. 969-982
    • Gray, P.R.1    Meyer, R.G.2
  • 14
    • 0004146230 scopus 로고    scopus 로고
    • STMicroelectronics, Agrate Brianza (MI), Italy
    • 'BCD3s layout manual'. STMicroelectronics, Agrate Brianza (MI), Italy, 1997
    • (1997) BCD3s Layout Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.