Two-dimensional structures of ferroelectric domain inversion in LiNbO3 by direct electron beam lithography

Journal of Applied Physics

Volumn 93, Issue 12, 2003, Pages 9943-9946

  He, J ^a   Tang, S H ^a   Qin, Y Q ^a   Dong, P ^a   Zhang, H Z ^a   Kang, C H ^a   Sun, W X ^a   Shen, Z X ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; CRYSTALS; ELECTRIC CHARGE; ELECTRON BEAM LITHOGRAPHY; ELECTRON IRRADIATION; ETCHING; FERROELECTRICITY;

FERROELECTRIC DOMAIN INVERSION;

LITHIUM NIOBATE;

EID: 0038819915     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1575918     Document Type: Article

References (23)

1. M. M. Fejer, G. A. Magel, D. H. Jundt, and R. L. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
2. S. Miyazawa, J. Appl. Phys. 50, 4599 (1979).
3. S. Thaniyavarn, T. Finddakly, D. Boeher, and J. Moen, Appl. Phys. Lett. 46, 933 (1985).
4. K. Yamamoto, K. Mizunchi, K. Takeshige, Y. Sasai, and T. Tanichi, J. Appl. Pays. 70, 1947 (1991).
5. C. J. Van Der Poel, J. D. Bierlen, J. B. Brown, and S. Colak, Appl. Phys. Lett. 57, 2074 (1992).
6. L. E. Myers, R. C. Eckardt, M. M. Fejer, R. L. Byer, W. R. Bosenberg, and J. W. Pierce, J. Opt. Soc. Am. B 12, 2102 (1995).
7. G. D. Miller, R. G. Batchko, M. M. Fejer, and R. L. Byer, Proc. SPIE 2700, 34 (1996).
8. S.-n. Zhu, Y.-y Zhu, Yi.-q Qin, H.-f Wang, C.-z Ge, and N.-b Ming, Phys. Rev. Lett. 78, 2752 (1997).
9. 9 S.-n. Zhu, Y.-y. Zhu, and N.-b. Ming, Science (Washington, DC, U.S.) 278, 843 (1997).
10. G. Rosenman, K. Garb, A. Skliar, M. Oron, D. Eger, and M. Katz, Appl. Phys. Lett. 73, 865 (1998).
11. C. Restoin, C. Darraud-Taupiac, J. L. Decossas, and J. C. Vareille, J. Appl. Phys. 88, 6665 (2000).
12. W.-y. Hsu and M. C. Gupta, Appl. Phys. Lett. 60, 1 (1992).
13. M. C. Gupta, W. P. Risk, A. C. G. Nutt, and S. D. Lau, Appl. Phys. Lett. 63, 1167 (1993).
14. M. Fujimura and T. Suhara, J. Lightwave Technol. 11, 1360 (1993).
15. S. Kurimura, I. Shimoya, and Y. Uesu, Jpn. J. Appl. Phys., Part 2 35, L31 (1996).
16. A. Nakao, K. Fujita, T. Suhara, and H. Nishihara, Jpn. J. Appl. Phys., Part 1 37, 845 (1998).
17. V. Berger, Phys. Rev. Lett. 81, 4136 (1998).
18. N. G. R. Broderick, G. W. Ross, H. L. Offerhaus, D. J. Richardson, and D. C. Hanna, Phys. Rev. Lett. 84, 4345 (2000).
19. A. Chowdhury, S. C. Hagness, and L. McCaughan, Opt. Lett. 25, 832 (2000).
20. A. Chowdhury, C. Staus, B. F. Boland, T. F. Kuech, and L. McCaughan, Opt. Lett. 26, 1353 (2001).
21. S. S. Saltiel and Y. S. Kivshar, Opt. Lett. 25, 1204 (2000).
22. M. de Sterke, S. S. Saltiel, and Y. S. Kivshar, Opt. Lett. 26, 539 (2001).
23. C. Restoin, S. Massy, C. Darraud-Taupiac, and A. Barthelemy, Opt. Mater. 22, 193 (2003).