A new method to measure the high-shear bulk properties of pressure sensitive adhesives used in LCD devices

Journal of Adhesion Science and Technology

Volumn 17, Issue 6, 2003, Pages 889-901

  Sohn, Seungman ^a  

^a LG Chemical Ltd   (South Korea)

Author keywords

Crosslinking; Molar mass; Polarizer; Pressure sensitive adhesives; Rheology; TFT LCD

Indexed keywords

ADHESIVES; BOND STRENGTH (MATERIALS); CROSSLINKING; DEBONDING; DELAMINATION; LIQUID CRYSTAL DISPLAYS; RESIDUAL STRESSES; RHEOLOGY; TEMPERATURE; THIN FILM TRANSISTORS; ELASTICITY; MOLAR MASS; OPTICAL INSTRUMENTS; PEELING; SUBSTRATES;

HIGH-SHEAR BULK PROPERTIES; MOLAR MASS; PARTIAL DELAMINATION; PRESSURE SENSITIVE ADHESIVES;

SHEAR DEFORMATION; THIN FILM TRANSISTORS;

BULK PROPERTIES; POLARIZER; PRESSURE SENSITIVE ADHESIVES; RHEOLOGICAL BEHAVIORS; RHEOLOGICAL PROPERTY; TFT-LCDS; THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAYS;

EID: 0038818025     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/156856103321645220     Document Type: Article

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