Direct characterization of terahertz radiation from the dynamics of the semiconductor surface field

Applied Physics Letters

Volumn 77, Issue 18, 2000, Pages 2864-2866

  Han, P Y ^a   Huang, X G ^a   Zhang, X C ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038814442     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1320866     Document Type: Article

References (13)

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