Fresnel coefficients of a rough interface

Applied Physics Letters

Volumn 74, Issue 19, 1999, Pages 2740-2742

  Lerondel G ^a   Romestain, R ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b LIPHY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038809446     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123999     Document Type: Article

References (12)

1. Lord Rayleigh, Philos. Mag. 14, 70 (1907).
2. H. Davies and G. G. Macfarlane, Proc. Phys. Soc. London 58, 717 (1946).
3. H. Davies, Proc. Inst. Electr. Eng. 101, 209 (1954).
4. H. E. Bennett and J. O. Porteus, J. Opt. Soc. Am. 51, 123 (1960).
5. J. M. Elson and R. H. Ritchie, Phys. Status Solidi B 62, 461 (1974).
6. V. Celli, A. Marvin, and F. Toigo, Phys. Rev. B 11, 1779 (1975).
7. A. Marvin, F. Toigo, and V. Celli, Phys. Rev. B 11, 2777 (1975).
8. G. Lérondel and R. Romestain, in Properties of Porous Silicon, emis datareview series 18 inspec editions, edited by L. Canham, Chap. 8.5, p. 241.
9. G. Lérondel, R. Romestain, F. Madeore, and F. Muller, Thin Solid Films 276, 80 (1996).
10. G for the forward-scattered amplitude. But it should be remembered that all expressions are valid even for arbitrary complex k′s.
11. We used the relations 2.14 a, b, c, and d in A. Marvin, F. Toigo, and V. Celli, Phys. Rev. B 11, 2777 (1975).
12. L. Landau and E. Lifchitz, Électrodynamique des Milieux Continus, Vol. 8 Chap. X, p. 417.