Surface topography and alignment effects in UV-modified polyimide films with micron size patterns

Chinese Journal of Physics

Volumn 41, Issue 2, 2003, Pages 177-184

  Pan, Ru Pin ^a   Chiu, Hua Yu ^a   Lin, Yea Feng ^a   Huang, J Y ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038796593     PISSN: 05779073     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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