A numerical assessment of the durability of thermal barrier systems that fail by ratcheting of the thermally grown oxide

Acta Materialia

Volumn 51, Issue 13, 2003, Pages 3807-3820

  Xu, T ^a   He, M Y ^a   Evans, A G ^a  

^a University of California   (United States)

Author keywords

Computer simulation; Crack; Electron beam physical vapor deposition coatings; Layered materials; Thermal barrier systems; Thermal fatigue

Indexed keywords

COALESCENCE; CRACKS; DURABILITY; ELECTRON BEAMS; PHYSICAL VAPOR DEPOSITION; THERMAL CYCLING; TOUGHNESS;

THERMALLY GROWN OXIDES;

THERMAL BARRIER COATINGS;

EID: 0038789100     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(03)00194-0     Document Type: Article

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