Submicron periodically poled flux-grown KTiOPO4

Applied Physics Letters

Volumn 82, Issue 24, 2003, Pages 4233-4235

  Canalias, C ^a   Pasiskevicius, V ^a   Clemens, R ^a,b   Laurell, F ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFRACTION GRATINGS; ELECTRON BEAM LITHOGRAPHY; FERROELECTRICITY; POTASSIUM COMPOUNDS; REFRACTIVE INDEX;

ELECTRIC-FIELD POLING;

CRYSTALS;

EID: 0038787857     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1583144     Document Type: Article

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