Growth and TEM and HREM characterisation of TiC crystals grown from high-temperature solutions

Crystal Research and Technology

Volumn 38, Issue 3-5, 2003, Pages 283-287

  Strzeciwilk, D ^a   Wokulski, Z ^a   Trackz, P ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

High temperature solutions; HREM; Microstructure; TEM; Titanium carbide crystals

Indexed keywords

COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); MORPHOLOGY; NICKEL; SCANNING ELECTRON MICROSCOPY; SOLVENTS; TITANIUM CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

IONIC THINNING; SOFTWARE PACKAGE ELECTRON MICROSCOPY IMAGE SIMULATION;

CRYSTAL GROWTH;

EID: 0038784386     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200310032     Document Type: Article

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