Characterization of amorphous Ni-P coatings by small angle X-ray scattering

Journal of the Electrochemical Society

Volumn 150, Issue 7, 2003, Pages

  Tatchev, D ^a   Kranold, R ^b   Armyanov, S ^a  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Bulgaria)

^b UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLIZATION; ELECTRODEPOSITION; ELECTRONIC DENSITY OF STATES; HEAT TREATMENT; NICKEL ALLOYS; NUMERICAL METHODS; PARTICLE SIZE ANALYSIS; THERMODYNAMIC STABILITY; X RAY SCATTERING;

ELECTRON DENSITY FLUCTUATIONS; MAXIMUM ENTROPY METHOD; NICKEL PHOSPHIDE COATINGS; SMALL ANGLE X RAY SCATTERING;

PROTECTIVE COATINGS;

EID: 0038783343     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1582464     Document Type: Article

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