Structural stability of PbS films as a function of temperature

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 506-510

  Qadri, Syed B ^a   Singh, Alok ^b   Yousuf, M ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b GEORGE WASHINGTON UNIVERSITY   (United States)

Author keywords

PbS films; Resistivity; Structural stability; Temperature; X ray diffraction

Indexed keywords

ELECTRIC CONDUCTIVITY; HIGH TEMPERATURE EFFECTS; LEAD COMPOUNDS; RADIATION DETECTORS; SENSORS; X RAY POWDER DIFFRACTION;

BAND GAP;

THIN FILMS;

EID: 0038783103     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00245-1     Document Type: Conference Paper

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