Broadband antireflection properties of thin heterogeneous dielectric films

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 17, Issue 12, 2000, Pages 2267-2271

  Shvartsburg, Alexander B ^a   Petite, Guillaume ^b   Hecquet, Pascal ^c  

^a SCIENTIFIC AND TECHNOLOGICAL CENTER OF UNIQUE INSTRUMENTATION   (Russian Federation)

^b ECOLE POLYTECHNIQUE   (France)

^c CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELLIPSOMETRY; MAXWELL EQUATIONS; RAYLEIGH SCATTERING; THIN FILMS;

ANTIREFLECTION PROPERTIES;

DIELECTRIC FILMS;

EID: 0038780157     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.17.002267     Document Type: Article

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