Effect of neutron irradiation on laser diode properties

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1174, Issue , 1990, Pages 233-261

  Barnes, C ^a   Heflinger, D ^a   Reel, R ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIODE PROPERTIES; FAR-FIELD PATTERNS; FAST NEUTRON IRRADIATION; INDIRECT EFFECTS; LASER CURRENTS; NEAR FIELD PATTERNS; NEUTRON FLUENCES; THRESHOLD CURRENTS;

SEMICONDUCTOR LASERS;

NEUTRON IRRADIATION;

EID: 0038773947     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.963249     Document Type: Conference Paper

References (2)

1. Toigo, F., Marvin, A., Celli, V., and Hill, N. R., "Optical properties of rough surfaces: General theory and the small roughness limit," Phys. Rev., Vol. B15, pp. 5618-5626. 1977.
2. Bendat, J. S., and Picrsol, A. G., Random Data: Analysis and Measurement Procedures, Wiley, New York, 1971, pp. 64-65.