Static and low frequency noise characterization in surface- and buried-mode 0.1 μm PMOSFETS

Solid-State Electronics

Volumn 47, Issue 7 SPEC., 2003, Pages 1155-1160

  Fadlallah, M ^a   Ghibaudo, G ^a   Jomaah, J ^a   Guegan G ^b  

^a IMEP LAHC   (France)

^b CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; DIGITAL CIRCUITS; GATES (TRANSISTOR); POLYSILICON; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE;

DRAIN INDUCED BARRIER LOWERING (DIBL);

MOSFET DEVICES;

EID: 0038756012     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(03)00047-9     Document Type: Conference Paper

References (8)

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