An internal stress pattern in free standing films

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 312, Issue 1-2, 2003, Pages 119-122

  Cai, Ping Gen ^a   Yu, Sen Jiang ^a   Ye, Quan Lin ^a   Jin, Jin Sheng ^a   Ye, Gao Xiang ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Crack; Liquid substrate; Stress pattern; Thin film growth

Indexed keywords

CRACKS; FILM GROWTH; SILICONES;

CHARACTERISTIC BOUNDARY CONDITIONS; FREESTANDING FILMS; LIQUID SUBSTRATE; NI FILMS; SILICONE OIL; STRESS PATTERNS;

THIN FILMS;

NICKEL;

ARTICLE; FILM; GROWTH; MORPHOLOGY; PHYSICS; STRESS;

EID: 0038751724     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0375-9601(03)00612-1     Document Type: Article

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