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Volumn 206, Issue , 2003, Pages 1092-1096
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Electron microscopy and optical spectroscopy study of xenon-implanted yttria-stabilized zirconia
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Author keywords
Ion implantation; Irradiation effects; Optical measurements; Transmission electron microscopy; Yttria stabilized zirconia
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Indexed keywords
AMORPHIZATION;
ION IMPLANTATION;
LIGHT ABSORPTION;
PHOTOLUMINESCENCE;
SPECTROSCOPIC ANALYSIS;
TRANSMISSION ELECTRON MICROSCOPY;
XENON;
YTTRIUM COMPOUNDS;
OPTICAL SPECTROSCOPY;
ZIRCONIA;
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EID: 0038750695
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(03)00917-0 Document Type: Conference Paper |
Times cited : (16)
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References (24)
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