Direct observation of Ag intercell hopping on the Si(1 1 1)-(7 × 7) surface

Surface Science

Volumn 537, Issue 1-3, 2003, Pages

  Sobotik P ^a   Kocan P ^a   Ost'adal I ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Adatoms; Low index single crystal surfaces; Scanning tunneling microscopy; Silicon; Silver; Surface defects; Surface diffusion

Indexed keywords

ACTIVATION ENERGY; DEFECTS; DIMERS; SCANNING TUNNELING MICROSCOPY; SILVER; SINGLE CRYSTALS; SURFACE STRUCTURE;

SURFACE DIFFUSION;

SURFACE CHEMISTRY;

EID: 0038749573     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00608-3     Document Type: Article

References (14)

1. Lo R.-L., Hwang I.-S., Ho M.-S., Tsong T.T. Phys. Rev. Lett. 80:1998;5584.
2. Gómez-Rodríguez J.M., Sáenz J.J., Baró A.M., Veuillen J.Y., Cinti R.C. Phys. Rev. Lett. 76:1996;799.
3. Mo Y.W. Phys. Rev. Lett. 69:1992;3643.
4. Mo Y.W. Phys. Rev. Lett. 71:1993;2923.
5. Ganz E., Theiss S.K., Hwang I., Golovchenko J. Phys. Rev. Lett. 68:1992;1567.
6. Kitamura N., Lagally M.G., Webb M.B. Phys. Rev. Lett. 71:1993;2082.
7. Zhang Z., Wu F., Zandvliet H.J.W., Poelsema B., Metiu H., Lagally M.G. Phys. Rev. Lett. 74:1995;3644.
8. Hirayama H., Okamoto H., Takayanagi K. Phys. Rev. B. 60:1999;14260.
9. Ošt'ádal I., Sobotík P., Mysliveček J., Jarolímek T. Czech. J. Phys. 49:1999;1613.
10. Jarolímek T., Sobotík P., Ošt'ádal I., Mysliveček J. Surf. Sci. 482-485:2001;386.
11. Takayanagi K., Tanishiro Y., Takahashi M., Takahashi S. J. Vac. Sci. Technol. A. 3:1985;1502.
12. Machlup S. J. Appl. Phys. 25:1954;341.
13. Mysliveček J., Sobotík P., Ošt'ádal I., Jarolímek T., Šmilauer P. Phys. Rev. B. 63:2001;045403.
14. Cho K., Kaxiras E. Europhys. Lett. 39:1997;287.