Application of polarimetry and interferometry to liquid crystal-film research

Materials Research Bulletin

Volumn 7, Issue 4, 1972, Pages 267-278

  Chang, Roger ^a  

^a North American Rockwell Science Center Thousand Oaks ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038746010     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/0025-5408(72)90203-6     Document Type: Article

References (7)