Determination of minority carrier lifetimes in CuInSe2 thin films

Applied Physics Letters

Volumn 69, Issue 22, 1996, Pages 3375-3377

  Puech, K ^a   Zott, S ^a   Leo, K ^a   Ruckh, M ^b   Schock, H W ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038743620     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117264     Document Type: Article

References (13)

1. K. Zweibel, H. S. Ullal, and B. G. von Roedern, Proceedings of the 25th IEEE Photovoltaic Specialists Conference. Washington (1996) (to be published).
2. B. Dimmler, E. Gross, R. Menner, M. Powalla, D. Hariskos, M. Ruckh, U. Ruehle, and H.-W. Schock, Proceedings of the 25th IEEE Photovoltaic Specialists Conference, Washington (1996) (to be published).
3. J. R. Tuttle, J. S. Ward, A. Duda, T. A. Berens, M. A. Contreras, K. R. Ramanathan, A. L. Tennant, J. Keane, E. D. Cole, K. Emery, and R. Noufi, Proceedings of the 1996 Spring MRS Meeting. San Francisco (1996) (to be published).
4. H. Kukimoto, Jpn. J. Appl. Phys. 32, 10 (1993).
5. D. J. Bottomley, A. Mito, S. Niki, and A. Yamada, Opt. Lett. 21, 254 (1996).
6. G. Bacher, W. Braun, B. Ohnesorge, A. Forchel, F. H. Karg, and W. Riedl, Cryst. Res. Technol. 31, 737 (1996).
7. R. Klenk, T. Walter, H.-W. Schock, and D. Cahen, Adv. Mater. 5, 114 (1993).
8. S. Zott, K. Leo, M. Ruckh, and H.-W. Schock, Appl. Phys. Lett. APPLAB 68, 1144 (1996).
9. S. Zott, K. Leo, M. Ruckh and H.-W. Schock, Proceedings of the 25th IEEE Photovoltaics Specialists Conference, Washington (1996) (to be published).
10. D. Schmid, M. Ruckh, F. Grunwald, and H.-W. Schock, J. Appl. Phys. 73, 2902 (1993).
11. T. Walter, R. Menner, Ch. Köbele, and H.-W. Schock, in Proceedings of the 12th EC Photovoltaic Solar Energy Conference (H. S. Stephens, Bedford, 1994), p. 1755.
12. R. K. Ahrenkiel, in Semiconductors and Semimetals (Academic Boston, 1993), Vol. 39, Chap. 2.
13. J. R. Tuttle, D. Albin, R. J. Matson, and R. Noufi, J. Appl. Phys. 66, 4408 (1989).