Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces

Langmuir

Volumn 19, Issue 7, 2003, Pages 3056-3061

  Lorenz Haas, C ^a   Muller Buschbaum P ^b   Wunnicke, O ^c   Cassignol, C ^a   Burghammer, M ^d   Riekel, C ^d   Stamm, M ^c  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c LEIBNIZ INSTITUTE OF POLYMER RESEARCH DRESDEN   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; ENERGY DISSIPATION; MICROMETERS; POLYMETHYL METHACRYLATES; TRANSMISSION ELECTRON MICROSCOPY; WELDING; X RAY SCATTERING;

DEFECT STRUCTURES; ENERGY DISSIPATION ZONE; SCANNING SMALL ANGLE X RAY SCATTERING;

INTERFACES (MATERIALS);

EID: 0038737909     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la026693+     Document Type: Article

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