Three dimensional crystallization simulation and recording layer thickness effect in phase change optical recording

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 2 B, 2003, Pages 800-803

  Fan, Zhaohui ^a   Laughlin, David E ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

3 D crystallization model; Crystallization simulation; GeSbTe; Phase change optical recording; Thickness effects

Indexed keywords

COMPUTER SIMULATION; CRYSTALLIZATION; ISOTHERMS; MATHEMATICAL MODELS; THICKNESS MEASUREMENT; THREE DIMENSIONAL;

PHASE CHANGE OPTICAL RECORDING; PHASE CHANGE RECORDING MATERIAL; RECORDING LAYER THICKNESS EFFECT;

OPTICAL RECORDING;

EID: 0038735713     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.800     Document Type: Article

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