Burn-in test reduction for the digital micromirror device (DMD)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4980, Issue , 2003, Pages 317-323

  Hogan, Timothy ^a   Barker, Paul ^a   Douglass, Mike ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

Burn in test; DLP ; DMD; Infant mortality; MEMS; Micromirror; Reliability

Indexed keywords

FAILURE ANALYSIS; MIRRORS; RELIABILITY; TESTING;

TEST REDUCTION;

MICROELECTROMECHANICAL DEVICES;

EID: 0038735274     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.478211     Document Type: Conference Paper

References (4)

1. L.J. Hornbeck, "Digital Light Processing for High-Brightness High-Resolution Applications": Proceedings, SPIE, Vol.3013, pp. 27-40, EI '97 Projection Displays III (1997)
2. th Annual International Reliability Physics Symposium, Reno, Nevada, March 31, April 1-2, 1998, pp. 9-16
3. R.L Knipe, "Challenges of a Digital Micromirror Device: Modeling and Design", SPIE EurOpto Proceedings, Vol 2783, pp 135-145 (June 1996).
4. Devore and Peck, Statistics, The Exploration and Analysis of Data, Duxbury Press, Belmont California, chapter 16, p817