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Volumn 104, Issue , 2003, Pages 85-90
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The transmission X-ray microscope at BESSY II
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
IMAGE ANALYSIS;
OPTICAL DESIGN;
OPTICAL DEVICES;
ROTATING CONDENSER;
SOFT X RAYS;
TRANSMISSION X RAY MICROSCOPY;
UNDULATOR BEAMLINE;
X RAY MICROSCOPES;
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EID: 0038730824
PISSN: 11554339
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1051/jp4:200300035 Document Type: Conference Paper |
Times cited : (18)
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References (6)
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