Bayes factors for edge detection from wavelet product spaces

Optical Engineering

Volumn 42, Issue 5, 2003, Pages 1375-1382

  Murtagh, Fionn ^a   Starck, Jean Luc ^b  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^b UNIVERSITÉ PARIS DIDEROT   (France)

Author keywords

Bayes factor; Bayes information criterion; Edge detection; Heavy tailed distribution; Likelihood; PLIC; Pseudolikelihood information criterion; Segmentation; Wavelet transform

Indexed keywords

EDGE DETECTION; IMAGE PROCESSING; MARKOV PROCESSES;

BAYES FACTORS;

WAVELET TRANSFORMS;

EID: 0038718950     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1564104     Document Type: Review

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