Relationship of quantitative x-ray diffraction measurements of geologic materials to cesium sorption

Radiochimica Acta

Volumn 90, Issue 9-11, 2002, Pages 705-711

  Payne, Timothy E ^a   Bertram, Willem K ^a   Itakura, Takashi ^a   Raven, Mark D ^b  

^a AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^b CSIRO   (Australia)

Author keywords

Cesium; Quantitative XRD; Rietveld analysis; Smectite; Sorption Illite

Indexed keywords

ALUMINUM SILICATE; CESIUM; ILLITE; MINERAL; SILICON DIOXIDE; UNCLASSIFIED DRUG;

ADSORPTION; ANALYTIC METHOD; AUSTRALIA; BET SURFACE AREA; CLAY; COMPUTER PROGRAM; CONFERENCE PAPER; CORRELATION ANALYSIS; DISTRIBUTION COEFFICIENT; GEOLOGY; MEASUREMENT; PHYSICAL PHENOMENA; PREDICTION AND FORECASTING; QUANTITATIVE X RAY DIFFRACTION; RIETVELD ANALYSIS; SORPTION; STATISTICAL ANALYSIS; THERMODYNAMICS; X RAY DIFFRACTION;

EID: 0038717729     PISSN: 00338230     EISSN: None     Source Type: Journal    
DOI: 10.1524/ract.2002.90.9-11_2002.705     Document Type: Conference Paper

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