Predicting whole-program locality through reuse distance analysis

Proceedings of the ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI)

Volumn , Issue , 2003, Pages 245-257

  Ding, Chen ^a   Zhong, Yutao ^a  

^a University of Rochester   (United States)

Author keywords

Data locality; Pattern recognition and prediction; Profiling; Program locality; Reuse distance; Sampling; Stack distance; Training

Indexed keywords

ALGORITHMS; OPTIMIZATION; PATTERN RECOGNITION;

REUSE DISTANCE ANALYSIS;

PROGRAM PROCESSORS;

EID: 0038716440     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/781158.781159     Document Type: Conference Paper

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