Grain size dependent grain boundary defect structure: Case of doped zirconia

Acta Materialia

Volumn 51, Issue 9, 2003, Pages 2539-2547

  Guo, Xin ^a   Zhang, Zaoli ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Electrical conductivity; Grain boundaries; High resolution electron microscopy (HREM); Oxygen vacancy; Zirconium oxide

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; SCHOTTKY BARRIER DIODES; SPECTROSCOPIC ANALYSIS;

OXYGEN VACANCY;

ZIRCONIA;

EID: 0038713195     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(03)00052-1     Document Type: Article

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