Zernike phase-contrast X-ray microscope with an X-ray refractive lens

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 603-606

  Kohmura, Y ^a   Takeuchi, A ^a   Takano, H ^a   Suzuki, Y ^a   Ishikawa, T ^a  

^a SPring 8 ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; OPTICAL DESIGN; OPTICAL INSTRUMENT LENSES; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SPECKLE; SURFACES; X RAY OPTICS;

FRESNEL ZONE PLATE; X RAY REFRACTIVE LENS; ZERNIKE PHASE CONTRAST X RAY MICROSCOPE;

X RAY MICROSCOPES;

EID: 0038702038     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030154     Document Type: Conference Paper

References (6)

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4. M. Awaji, Y. Suzuki, A. Takeuchi, H. Takano, N. Kamijo, S. Tamura and M. Yasumoto, J. Synchrotron Rad. 9 (2002) 125.
5. Y. Kohmura, M. Awaji, Y. Suzuki, T. Ishikawa, Y.I. Dudchik, N.N. Kolchevsky, and F.F. Komarov, Rev. Sci. Instrum. 70 (1994) 4164.
6. Y.I. Dudchik, and N.N. Kolchevsky, Nucl. Instrum. Methods Phys. Res. A 421 (1999) 361.