A simple method for determination of the electron work function of different crystallographic faces of copper

Physica Status Solidi (A) Applied Research

Volumn 196, Issue 2, 2003, Pages 390-395

  Li, Wen ^a   Li, D Y ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CALCULATIONS; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); FRICTION; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; TEXTURES; TRIBOLOGY; WEAR OF MATERIALS;

ELECTRON WORK FUNCTION; KELVIN PROBING TECHNIQUE; SURFACE MICROSTRUCTURE;

COPPER;

EID: 0038699444     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200305939     Document Type: Article

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