Scanning probe microscopy and computer simulations: Complementary techniques for nanostructured materials and thin films

Crystal Research and Technology

Volumn 38, Issue 3-5, 2003, Pages 250-266

  Richter, A ^a   Smith, R ^b  

^a TECHNICAL UNIVERSITY OF APPLIED SCIENCES WILDAU   (Germany)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

C60 films; Molecular dynamics simulations; Monte Carlo simulations; Nanoindentation; Scanning force microscopy; Thin film growth

Indexed keywords

CARBON; CHEMICAL BONDS; COMPUTER SIMULATION; CRYSTAL SYMMETRY; INDENTATION; MICROSCOPIC EXAMINATION; MOLECULAR DYNAMICS; MONTE CARLO METHODS; NANOSTRUCTURED MATERIALS; SILICON; STACKING FAULTS; THIN FILMS;

NANOINDENTATION; SCANNING FORCE MICROSCOPY; THIN FILM GROWTH;

FILM GROWTH;

EID: 0038699367     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200310029     Document Type: Article

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