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Volumn 67-68, Issue , 2003, Pages 487-494

Batch processing of CMOS compatible feedthroughs

Author keywords

Batch processing; CMOS compatible; Electrical feedthrough; Electrodeposited photoresist; KOH resistant PECVD nitride

Indexed keywords

DIELECTRIC MATERIALS; ELECTRODEPOSITION; ELECTRONICS PACKAGING; ETCHING; PHOTORESISTS; SILICON WAFERS; SPUTTER DEPOSITION;

EID: 0038696525     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(03)00105-9     Document Type: Conference Paper
Times cited : (5)

References (6)
  • 6
    • 4243719560 scopus 로고    scopus 로고
    • Ph.D. thesis, PEL, Swiss Federal Institute of Technology, Zurich
    • U. Münch, Ph.D. thesis, PEL, Swiss Federal Institute of Technology, Zurich, 2000.
    • (2000)
    • Münch, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.