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Volumn 67-68, Issue , 2003, Pages 769-774

Novel technologies for the realisation of GaAs pHEMTs with 120 nm self-aligned and nanoimprinted T-gates

Author keywords

GaAs pHEMT; Nanoimprint; Ohmic contact; Self aligned; Succinic acid

Indexed keywords

ELECTRIC CONDUCTIVITY; GATES (TRANSISTOR); NANOSTRUCTURED MATERIALS; OHMIC CONTACTS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DOPING; TRANSCONDUCTANCE;

EID: 0038696458     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(03)00137-0     Document Type: Conference Paper
Times cited : (13)

References (5)
  • 4
    • 0036883182 scopus 로고    scopus 로고
    • The fabrication of high electron mobility transistors with T-gates by nanoimprint lithography
    • Chen Y., Macintyre D., Boyd E., Moran D., Thayne I., Thoms S. The fabrication of high electron mobility transistors with T-gates by nanoimprint lithography. J. Vac. Sci. Technol. B. 20:2002;2887.
    • (2002) J. Vac. Sci. Technol. B , vol.20 , pp. 2887
    • Chen, Y.1    Macintyre, D.2    Boyd, E.3    Moran, D.4    Thayne, I.5    Thoms, S.6
  • 5
    • 0020129227 scopus 로고
    • Obtaining the specific contact resistance from transmission line model measurements
    • Reeves G.K., Harrison H.B. Obtaining the specific contact resistance from transmission line model measurements. IEEE Electron Device Letters. 3:(5):1982;111-113.
    • (1982) IEEE Electron Device Letters , vol.3 , Issue.5 , pp. 111-113
    • Reeves, G.K.1    Harrison, H.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.