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Volumn 155, Issue 1-4, 2001, Pages 397-401
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Computer modelling of intrinsic defects and migration processes in KY3F10
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Author keywords
Intrinsic defects; KY3F10, Computer simulation; Migration processes
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Indexed keywords
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EID: 0038694321
PISSN: 10420150
EISSN: None
Source Type: Journal
DOI: 10.1080/10420150108214144 Document Type: Article |
Times cited : (3)
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References (9)
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