메뉴 건너뛰기




Volumn 155, Issue 1-4, 2001, Pages 397-401

Computer modelling of intrinsic defects and migration processes in KY3F10

Author keywords

Intrinsic defects; KY3F10, Computer simulation; Migration processes

Indexed keywords


EID: 0038694321     PISSN: 10420150     EISSN: None     Source Type: Journal    
DOI: 10.1080/10420150108214144     Document Type: Article
Times cited : (3)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.