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Volumn , Issue , 2003, Pages 1463-1467

Cost-performance wafer thinning technology

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL POLISHING; COST EFFECTIVENESS; ELECTRONICS PACKAGING; ETCHING; GRINDING (MACHINING); INTEGRATED CIRCUIT MANUFACTURE; PERFORMANCE; QUALITY ASSURANCE;

EID: 0038688777     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (26)

References (5)
  • 2
    • 0037738153 scopus 로고    scopus 로고
    • Dry polishing technology information from Disco Japan
    • Dry polishing technology information from Disco Japan.
  • 3
    • 0038075738 scopus 로고    scopus 로고
    • Wet polishing technology information from Okamoto Japan
    • Wet polishing technology information from Okamoto Japan.
  • 4
    • 0038414236 scopus 로고    scopus 로고
    • Plasma etching technology information from Tru-Si U.S.A
    • Plasma etching technology information from Tru-Si U.S.A
  • 5
    • 0038752251 scopus 로고    scopus 로고
    • SPIL, "Polisher by-off report", "Polisher evaluation" and "Polishing analysis report"
    • SPIL internal reports
    • Jacky Chan, SPIL, "Polisher by-off report", "Polisher evaluation" and "Polishing analysis report" SPIL internal reports.
    • Chan, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.